Zeiss was organising in collaboration with LIST the 1st European Orion Nanofab SIMS Workshop where they introduced the new system combining ultimate high resolution imaging with chemical information.
This workshop took place on 4-5 December in Luxembourg. The event included presentations from internationally leading researchers covering high resolution SIMS applications in the fields of material science, life science and geology. Discover new trends in high resolution materials analysis whilst getting hands-on practical experience with this new technology.
More information can be found on the workshop website.